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| DSH 493! U- _" p3 m- u7 S/ y" a8 m8 O
0 |5 X' A5 s8 x: z0 q; s/ x | Abnormal operation1 |6 r8 \! ~: g- E4 i6 j, H
| 19.11.2
: Y) R. f0 a2 x8 i: w" P# H' Z; M | 60335-1(ed.3)" N* j5 k. d; b4 v- G8 Z% @
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Standard: IEC 60335-1:1991, 3rd Ed.
! K/ L9 o3 _% X) K1 KSub clause: 19.11.2; b: |8 N4 M' S1 ~6 u5 G
Sheet No. DSH-493
4 J$ X/ P( @3 y* O* p- `3 W( l KSubject: Abnormal operation' h0 p! X2 C9 w2 Q" l
Key words: - Microprocessors
% S( D& D# E2 E8 }! d3 x: @# T* ADecision taken at the 40th CTL meeting 2003/ u0 F. o0 Y7 C: { O8 _' a
Question:
/ h. y' o. a9 x& b# HShould faults be applied to microprocessors ?
- L. E* D; I2 n0 ^+ zRationale:1 I9 Y. J& Z7 `# p$ `
See question.2 G% W, V( _, [* w: Y
Decision:4 l' Y6 P: [: @% ] S
A stopped clock of microprocessors, is considered, as a relevant test, but only when the8 h8 c% F+ O8 {6 I( G( b) N
clock is stopped after one interruption or short-circuit (one fault).
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