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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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Page 9' J" T/ a8 n; W: ]. B
1 Scope and object
$ f# `( O8 |* ~# c& g( @( X2 k% q1 _Replace the title of this clause by “Scope”
9 ]8 p# ]5 l& j `1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
2 O- l, ?. e: ]7 l+ S6 R+ |' \Page 11. p7 {) X8 q7 W& t# I" f3 ]. x
2 Normative references9 R" U, ?/ W$ S f* V& e
Replace the text by the following:, K! g2 ~- H+ P+ Z- Z; S3 }
The following referenced documents are indispensable for the application of this document.
6 y4 O& @6 g& Y% p. o6 L/ m# X" P z& uFor dated references, only the edition cited applies. For undated references, the latest edition4 x. D' m1 p$ J% @9 v4 j
of the referenced document (including any amendments) applies., o+ M) m/ X( ?; H" Z
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161: X- [+ R1 W* S0 T4 |4 b
Electromagnetic compatibility
* b& r9 z$ Q r4 n# q
/ ?# t( a/ l" G) M
1 [' a4 p- c( p5 A( U' ^CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
- w! E' L, h% J7 q/ y5 r$ j" VIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and: c0 m7 K) }6 F0 s+ G) s
measurement techniques – Electrostatic discharge immunity test
. o& C. } Q/ V9 v& t+ ?0 @: RAmendment 1:19986 S" L6 F0 W/ Y* Z$ B! `8 A' {7 B
Amendment 2:20001
c; `5 l8 b* e6 B+ kIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and% |5 F- c% q5 W; ~) M, g% c( c
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test4 v0 p% e! G6 q' n2 N3 \0 W
Amendment 1:20072
9 Z: c5 r5 D3 k0 M1 D5 d" hIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and* p1 F# B# G5 X; N: D+ E0 z
measurement techniques – Electrical fast transient/burst immunity test
) @+ g" G5 Y6 nIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
' R0 W# p* ]$ W, N- N* l/ X7 ]measurement techniques – Surge immunity test
( T$ w+ ?: W; ?' L; W- x- lIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and7 o1 ]; U, c, V4 u F
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency5 N5 I( L# _- R
fields
0 L( J9 k! F% x" IAmendment 1:2004
! Z3 q) H2 a- P& iAmendment 2:20063
! }! j/ G+ C8 I% ] [3 v" }IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
8 N5 o# M; l, R/ R- y& Rmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests# \: t4 Z% S' f: N3 \( R. I
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,( z, {6 N9 B$ S. p8 f; K6 e
electric tools and similar apparatus – Part 1: Emission$ w- t9 N5 j: ~2 I
Page 13
2 a3 N, r1 O5 Z2 d3 r" Y1 f2 I3 Definitions
, O, a/ S6 j# U! y7 r* U* e5 aReplace the title of this clause by “Terms and definitions”.
& i) d5 n0 v7 r5 }& s2 JReplace the first paragraph by the following:
4 f+ @- j O& l! W6 C, lFor the purposes of this document, the terms and definitions related to EMC and related" F$ R& ?6 F! A0 D( Z, u
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
3 g& u+ R/ o9 ~: K1 k/ @: bAdd the following new definition:
, K7 @0 f2 G4 m3.18
4 n& {6 d& z& P4 M5 n8 \' Iclock frequency" J# @' B0 [- Q0 W' @$ v
fundamental frequency of any signal used in the device, excluding those which are solely
* e7 E9 @. n$ z2 j' H) N0 ?used inside integrated circuits (IC)
+ s) X y+ C% S7 ANOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits0 M4 y# E/ h7 N
from lower clock oscillator frequencies outside the IC.' n8 U. p1 S5 g5 m
___________
6 L4 E- x5 d. H1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
, Z" P: |1 m( k' a" n( E" [6 u/ u& O$ _( @2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
/ ]3 L, J7 \: F. b3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.9 g$ T8 \1 [# y9 {
9 p+ C/ ?0 p" r! m! ]/ t$ s7 d
+ ?$ h, U( I" {8 [" w& @– 4 – CISPR 14-2 Amend. 2 © IEC:2008
1 C9 q" b( A9 W* P7 B) aPage 139 C2 y4 A8 }+ y: Y! `! s
4 Classification of apparatus
1 h# o1 B6 \# e* n6 n8 l/ R4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
2 M7 T6 b* F1 Q3 l# d, {, oPage 15# Y# f. w$ X3 M# j
5 Tests
# g2 f: ~: J; E' q9 Y2 L! CThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”./ s) |- i& a- e
Page 21
, |3 L; |, |3 g' a4 @6 A6 @5.6 Surges+ p. K, u. C* Z3 ?8 ]: i
Table 12 – Input a.c. power ports0 c& m+ V: D: T) X
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
4 V, m* H8 |( t2 P# m. Y |6 `"Line-to-Line with 2 Ω Impedance".
. e) Q0 w/ Q5 p$ @0 tAfter Table 12, add the following paragraph as a new second paragraph:
, U* D! e+ N$ D+ IThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
( W2 @: U0 }' M$ K3 V6 j/ |5 }equipment under test, and the negative pulses are applied 270° relative to the phase angle of' x" g1 |. Z; I" }$ V6 N
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
; T" M1 g- l; o9 N" dgiven in Table 12 are not required.6 y: z( p! T* ~3 _ E
5.7 Voltage dips and interruptions
( L9 ^7 ^4 [1 U% tTable 13 – Input a.c. power ports
7 v3 y% b1 t3 D2 h, uReplace the existing Table 13 by the following new Table 13:, W: Z* y% @: }" K; J
Table 13 – Input a.c. power ports
$ X; T. ^% A2 w) m4 w0 l+ CDurations for voltage dips9 @ r; F5 W* I- e0 ~' T+ O/ Y, {' Y: Q
Environmental Test set-up, k4 }" r" ^. e+ Z# Y! ^/ y, C6 B
phenomena
. J0 A; a6 _$ ]1 n' MTest level9 g r( `7 g1 e! W# k/ x$ w7 J9 F
in % UT0 ~5 j, w ^4 y. r9 V
50 Hz 60 Hz
; `- o; E1 E6 {# }- b6 G' EVoltage dips; J, M, I( I/ K
in % UT
+ x( \' x. }5 v1 Y100
4 Y. X: @( S' K1 D! G8 ~% t5 K0 f60
0 I8 O5 ~, w, U5 @30! y7 Y3 f3 L( M$ |; J
0
9 k4 b* p; V2 g406 `! v' n+ Q7 M
707 w# H4 ?0 T! t$ g8 s) y3 D
0,5 cycle
6 y# c0 T6 o; r* X! h g6 F' D0 h10 cycles
; |% W9 x c5 D! g5 {8 `25 cycles/ [/ b* I0 J9 \
0,5 cycle+ p% ]1 ~" ?! s% v1 u! |' c
12 cycles
( O# I% R9 P2 D( w30 cycles* p/ [- c# W) |" S1 l' Y; V* i
IEC 61000-4-11) g- T" q! S& g* {. ?9 I) p! X
Voltage change shall) [$ S9 Z4 O9 G2 m
occur at zero crossing$ e8 P: ~$ D7 Q& Q3 d
UT is the rated voltage of the equipment under test.
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+ m1 ?4 V ?" s. U
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
6 F0 v8 ]) _9 m2 r4 q5 ^( v# iPage 27 q l( A t- o5 R! O1 P% }
8 Conditions during testing) }* d* H9 m9 o8 K" r F0 T2 v# L
8.1 Replace the first paragraph by the following paragraph:' P) c, Y4 L; Z# i+ w& g# f! G
Unless otherwise specified, the tests shall be made while the apparatus is operated as1 G7 R% q* u! i4 ?( k' o
intended by the manufacturer, in the most susceptible operating mode consistent with normal
$ J- @$ T$ ^! T7 wuse.. ^- Y4 N' [) x' ^2 e
8.4 Delete the second sentence.& P5 B" Z# \# G' W
8.7 Delete this subclause.
& x4 F. w6 {; K3 h8.8 Renumber this subclause as 8.7( r6 O3 S W: ]) h& o; k. E) Y5 |
Page 29; C& b# w" U/ p0 L& Z2 F% n4 `+ p
9 Assessment of conformity v; x9 d W3 d1 p- W2 K) A
9.2 Statistical evaluation
' e* O/ U8 e: W& ]& VReplace the existing Note by the following:# j# ~$ S! ]' p7 O3 M
NOTE For general information on the statistical consideration in the determination EMC compliance, see
+ I4 t, d) Q, b6 @# ?CISPR/TR 16-4-3.
; l( x1 |6 K, B* H2 y" IPage 31
" z+ P$ ^/ q. k10 Product documentation' a' \# \+ D& [) [: r3 t
Delete this clause.4 }0 p8 L1 B9 S; E2 ^6 T4 A
Bibliography! ~' L' z7 m+ z& @ |
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:; D |/ ^6 r P% g
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and# A" J f% D3 f0 ~7 y) w. s
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in2 r$ k3 g% n$ R u$ g2 I
the determination of EMC compliance of mass-produced products (only available in English) |
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