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由于我的标准上有公司名字，就不直接贴上了，差异部分如下6 i. {$ s4 S2 l. p6 J" x1 Z
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Page 9
4 ~6 j4 G# v3 e+ e1 Scope and object
% n6 V4 m0 O2 Y* b3 Y8 ZReplace the title of this clause by “Scope”
x& I# B& R* C9 a1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
+ p e M- ` d7 T6 ePage 11
0 _; R- }" f6 u5 B* c2 Normative references5 S- T! N% C3 I/ U- t
Replace the text by the following:7 `. f0 G( v( b$ G: k
The following referenced documents are indispensable for the application of this document.& Q9 u6 O* {: f) s5 V$ v6 {) i
For dated references, only the edition cited applies. For undated references, the latest edition% n& [" f# z8 A2 \; Y+ M# G) [
of the referenced document (including any amendments) applies.
8 ? R' }: ?6 n4 r5 YIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:" i/ e4 v6 W$ \3 }, N
Electromagnetic compatibility' g4 V. L; Y) x- K% I. X
! l( @% k5 ]: A
# O# d) T& a' f/ \0 U7 C
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –; W8 C n9 h2 O/ p
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and- e( w8 i3 e( I7 a0 M
measurement techniques – Electrostatic discharge immunity test
1 t: i" P+ G$ E0 t- V& q$ J- oAmendment 1:1998
; B+ F$ j4 T% a! \Amendment 2:20001% b9 D. A/ T) E8 B9 G
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and3 V! ^& g: ]3 b( r; v, }
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test Y+ x$ ^( Y0 I4 o1 {7 l! \
Amendment 1:20072
1 e' v' L$ x' B8 \IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and( e+ {; R+ T* a; X4 V
measurement techniques – Electrical fast transient/burst immunity test
) b0 K" y6 A0 \+ v5 @+ a. ?IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
6 Y7 }- I. Z1 `; X% s3 Qmeasurement techniques – Surge immunity test
3 D3 U ^2 I1 {" UIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and, J7 P( l5 y- j% F
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
# U6 x, F, U) Z% Sfields
( A: n- S% c8 GAmendment 1:20048 Y: p8 m& S( e9 Z _9 d" I0 @
Amendment 2:20063
' @% t1 c: D( OIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and0 S7 C3 _4 d T( L4 X* ~6 D/ {
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests* c4 ?, M$ ^' M+ V! N
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,* ~/ Z$ A' M8 [8 l6 O+ q
electric tools and similar apparatus – Part 1: Emission
y% h, X" e! l7 X k* r. cPage 13
/ F# `8 B V( X7 ?3 }% p' ^3 Definitions* K2 [0 V5 k" K2 W" M2 K+ ]6 B4 s
Replace the title of this clause by “Terms and definitions”.5 G5 ?: D% X7 ^ u" c
Replace the first paragraph by the following:' K' [+ H4 S( h- f) x. E5 m
For the purposes of this document, the terms and definitions related to EMC and related
( E1 M+ S3 O; w, ] @phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
% |# E7 h# Z- ~( C; ]8 `Add the following new definition:% K# c; ~: r: J
3.182 a! E; z- O2 U/ p, J( I
clock frequency
A, b [. Z% I; q6 o, _fundamental frequency of any signal used in the device, excluding those which are solely: b- V. X3 C, ` e' \
used inside integrated circuits (IC)+ x( q, R$ ?9 u7 H7 Z
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
( r) W$ a& E! xfrom lower clock oscillator frequencies outside the IC.* X N1 a5 c( e* k
___________( A/ s$ P% y; _" }5 D" T
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
- w; d% O( e, u W3 b- E6 `2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
. x/ ^6 C$ V+ M9 l" \3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.4 }) \, K* P6 j' c o6 G- L; n
& D" \3 M4 k! W+ s* `
( [ Z7 Y8 r+ u" H6 |. B# B
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
. p+ z) |- i& X- E3 f, [. ?Page 13
4 d# i* O9 F6 p3 L4 Classification of apparatus5 z. a& j7 q+ g- A6 O1 r
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.6 B% R5 W# D' k4 z& ?6 `6 M0 L
Page 15% t' k4 L: }8 }! _, n7 D; }- |
5 Tests
4 _1 L4 b- q% }9 [1 \9 Z% YThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.$ ]1 F6 `7 V" b+ V$ h6 t" Q: M
Page 21+ X6 i' e8 }5 X" t9 e _+ o
5.6 Surges0 b) p, j6 k5 Y- c9 b! }
Table 12 – Input a.c. power ports5 b/ k. g# V; c0 w% D4 m4 e
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add. N$ [% o: C9 `. z( h1 s
"Line-to-Line with 2 Ω Impedance".2 _( b1 c$ u5 R( n' v) b! |1 h
After Table 12, add the following paragraph as a new second paragraph:
5 O0 S# g. L- a4 o; {. \The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the) g& D- o% _: A6 q% W
equipment under test, and the negative pulses are applied 270° relative to the phase angle of! |0 x% b; S! N/ j- l! k7 Z2 w
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those/ B& r/ N7 i- t9 b( p- T8 A* L
given in Table 12 are not required.
8 e# Z( C. X) c: L5.7 Voltage dips and interruptions) c7 n7 l' r' r2 r0 t! N/ {* B C
Table 13 – Input a.c. power ports
# T1 E; n! p! X% ]Replace the existing Table 13 by the following new Table 13:" n/ [/ E7 L: {. H3 v. z
Table 13 – Input a.c. power ports% O8 U! Q) @4 Z% r6 Z
Durations for voltage dips' l+ b) R' a) ^- ]
Environmental Test set-up1 a* B) \- I5 z0 @
phenomena
8 ^2 H& o, L" t5 M6 N8 uTest level# m$ h: o9 ^ N3 N; a
in % UT
# [+ R% D' U* Q n( Q* ~. U50 Hz 60 Hz
3 d) J! ^3 j5 aVoltage dips; \# S2 ^" [$ E# N2 x
in % UT3 U: U6 T. Y: Z1 C
1005 w1 Q( f" Q9 \* w9 G- \5 F- _
60
8 s6 E9 k0 G) g" R q% e& m$ G30- y7 w; m, x8 P: N; v Q3 \) {! r
06 L( R/ g( H( v4 k* n' ]
40
7 G; n3 x. L- Q7 v. E. [8 M702 ]9 ]' I3 y* f. R- u) Z
0,5 cycle
0 A4 g P! {: j4 J2 P10 cycles0 ]! U( s- B6 k2 N
25 cycles
* y/ p2 J8 K" v: X- A; i0,5 cycle$ B+ n# s3 b! \4 u& o9 U0 W
12 cycles
) I# P$ Z+ Q `- o30 cycles# h! |& S6 _8 S( f
IEC 61000-4-11
7 t9 a2 U) |7 q) {4 S3 g, GVoltage change shall+ p) f# \" U* ~- w
occur at zero crossing7 D1 t: X4 S. F f* D" H+ ]3 F
UT is the rated voltage of the equipment under test.
$ Y! C6 s+ o3 H0 ^4 ^* [+ N/ Y
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: k* J1 }/ ~2 vCISPR 14-2 Amend. 2 © IEC:2008 – 5 –6 n/ |5 y# w4 I* Q8 N) g+ @
Page 27
/ _" l/ `4 U. T# e8 Conditions during testing
0 U- d; [8 u, w9 D7 Y0 |8.1 Replace the first paragraph by the following paragraph:
9 F! M: `% m' ]9 m) g+ P8 x* D& wUnless otherwise specified, the tests shall be made while the apparatus is operated as
% W8 D" J6 L! Q- wintended by the manufacturer, in the most susceptible operating mode consistent with normal7 G7 f, ^7 h3 i1 A! Z/ u
use.
9 y2 r% n6 E2 e1 x7 ^2 Y7 p8.4 Delete the second sentence./ Q J. [& a8 o5 V9 P' v" m
8.7 Delete this subclause.8 @' s# N: O: }. G5 p
8.8 Renumber this subclause as 8.7
' L* m7 j3 b! @5 B8 x: v' p+ nPage 29
0 D9 `) B1 u% {6 [9 Assessment of conformity
9 U8 H' Q; Y) A( x" E t& @! H9.2 Statistical evaluation
6 M; z9 ^0 M. N& g8 sReplace the existing Note by the following:
% s, f T! [: ]; {& \: vNOTE For general information on the statistical consideration in the determination EMC compliance, see
3 O# H8 h) L( X# Y- bCISPR/TR 16-4-3.
% \5 n8 d$ k' c7 t0 x1 a7 @7 `/ MPage 31: L# k5 U7 m t; Y" `6 n
10 Product documentation/ T- G5 F) d8 K2 F/ B; X
Delete this clause.2 s1 g! N5 D y% f
Bibliography
5 f+ F4 f6 F g( T/ TReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:, H! @- i# x" D: u' G( y7 A6 ~5 ]0 S
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and! G# f3 f$ P- T/ @
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
! k! S _' Y' E Sthe determination of EMC compliance of mass-produced products (only available in English) |
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