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' H3 x+ M9 q9 s3 c+ V, J
; A2 b7 s4 \: l% h) C1 [% i9 s3 s | Overload test0 x* H9 y, i- U4 P
| 14.7.2/4.4.2.6. A0 A- G" i3 G j
| 61010-1(ed.1);am1;am2$ w8 ?, U7 ?9 ^4 K& {! N/ [% i& B
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Standard:
$ F1 N/ K: B! WIEC 61010-1:1990 +A1:1992 + A2
; f ]( ]: T E, G% l:19958 d8 j) p% |. A2 B( ~
Sub clause:
3 R4 ]# C: v5 H; h) l: ^14.7.2/4.4.2.6
( y; j! C: Q# l0 B3 ^5 U6 N, RSheet n. 368" w# ]* v& K5 p& U1 t
Page 1(1)
6 Z7 x. b1 I2 G1 F' oSubject:
" O4 G# m) ~8 E( DOverload test
% ~$ p, a( N( d/ F( }Key words:
0 B0 _, R7 v1 D& O& g$ h- Mains transformer: U* l0 C* c4 a9 C, r$ p7 B
- SFC tests! ?7 y9 c7 i2 G! j; S3 e2 s
Decision taken by5 D* U: I% W" \/ s' ~
ETF3 and confirmed) X# X5 l; ~0 v
by CTL at its 38th
4 q2 s: u' J3 A$ m- p# ameeting, in Toronto
1 J. d4 b- D: k' l" J, \8 l7 p$ VQuestion:/ m% G& _% Q# M" @- Q' @- o
What criteria should be used when deciding whether or not to do the overload test as there
; \$ F/ Q/ q8 ]seems to be subjectivity involved when considering the requirements?% h1 P V' t) p2 U/ P
Decision:
/ _4 x! }! ]2 GIt was decided that transformers should be considered for SFC tests (short circuit and
4 B) {( b+ l5 v7 `9 Foverload tests) under the worst possible scenario.
4 S, Q8 f U& M* f. [% H$ j- G6 {: T: a
3 M k) ]8 g9 z& W- A. u, ?) k- Q3 O7 ?! M
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发表于 2012-9-18 11:57
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