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|  DSH 405+ _! P1 q9 D7 n7 V; y! D
8 |/ T; v/ J' A2 U* I( |4 H | Leakage current in secondary circuits& X7 Q. R: P6 A) Y) h8 r. N1 H
| 17g)
, g4 C; O; c. W( x. r1 ^! t | 60601-1(ed.2);am1;am2- H% b+ n8 |7 V u) m2 o* V9 U
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/ e3 T$ K% @: S) l# lStandard(s)- (year and edition):
) b Z+ m* X9 v' `; j/ S: x# vIEC 60601-1:1988 Ed.2 Am1+Am2
8 L+ c; I6 A* v' B, @: q( |Sub clause(s): 17 g)
1 B1 J6 c8 z- t3 ?Sheet n°: DSH-405- r+ @% {% L8 n" R ]& S2 ?' b
Subject: Leakage current in secondary circuits9 o3 w+ ?1 ^" u; a
Key words: Leakage current, secondary circuit
# J% r) Z# w7 j6 T6 LConfirmed by CTL at its 39th meeting, in Cologne
1 R+ E9 V" R! ^% r0 ^7 F: SQuestion:1 [$ e" s) W# l2 C+ p4 m
If secondary circuit impedances limit the leakage current, is further investigation of secondary
+ o( G0 q) C: f$ a" P: |9 Acircuits required? (refer to sub-clause 52.5).
4 x( X% P/ {+ W( Y# ~$ J) ]Decision:
3 y3 u- Z) s7 @& r" Z0 j. @Secondary circuits providing protective means after short-circuiting of inadequate AIR
3 Y" q3 o# A6 d K: |5 GCLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in( ^/ ]6 G9 t- }; L
these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such! i5 U q2 u! Q
components shall be investigated as a SINGLE FAULT CONDITION.
, ^, N8 X4 Z+ q* O- m8 [+ M4 M1 a2 k& \- Y
q% D$ |$ c+ D$ b2 X7 m
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发表于 2012-11-5 11:42
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