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Question
: X! s) q* Q' u; xIn which way shall the temperature rise test be carried out on a device composed of two or more
3 R! S F9 \& Bswitches, having the same or different pattern number mounted on a common body?6 z- z9 ]( u, a* F
The construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
; a2 F" g9 H! A; i! }8 @: y% Kin different ways in clause 17.1.
" b4 ]2 p7 Z6 R6 A# s. DDecision
. n& L3 W3 y; p+ J4 B% |1 kThe temperature rise test shall be performed separately on each individual switch on condition that it% i7 `; w& U6 R. V& o! m% g
is a single-phase switch.
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