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| DSH 4052 m; k7 D* N( g$ g/ W
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| Leakage current in secondary circuits# U0 J% L* U4 _' q, ^& R' ]
| 17g)
! V9 G5 X# z3 T! \. ~" T! a* K/ d | 60601-1(ed.2);am1;am25 a) u# [, Q: z q4 N9 v, n; U
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Standard(s)- (year and edition):9 W9 N8 J- q4 N) `
IEC 60601-1:1988 Ed.2 Am1+Am2# K0 z$ v( x' s. d3 l% t i. f ~1 ?8 L
Sub clause(s): 17 g)
& Q# @* n: n% z! R" }- dSheet n°: DSH-405. Y: S# \* V" Q5 R5 K5 s3 c
Subject: Leakage current in secondary circuits
+ i% N! E# n0 C1 UKey words: Leakage current, secondary circuit
: K0 Q; F d+ ?0 W" W1 G- UConfirmed by CTL at its 39th meeting, in Cologne* r. P" J$ Y$ h+ D' Z
Question:6 J4 F' a, o1 I3 j2 m" A
If secondary circuit impedances limit the leakage current, is further investigation of secondary
% G p3 ~7 ]* E' U% B; {: ecircuits required? (refer to sub-clause 52.5)." @! O6 Z% w) y' \# _
Decision:
' t& o [6 r' Z4 n5 w6 W+ WSecondary circuits providing protective means after short-circuiting of inadequate AIR
0 ~ U) G/ r- x. X+ c4 n) vCLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in: r2 b! V6 L; T6 @/ e1 Z, ~
these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such. l$ S* l1 @* {7 u8 o+ |* ^/ S4 A
components shall be investigated as a SINGLE FAULT CONDITION.9 v! H% c: g+ `) e2 V, B6 z5 ]$ L
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