DSH 659 Problem of setting a current applied to ACB of high current rating in in

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DSH 659 ( r4 |2 P, U' {: e

Problem of setting a current applied to ACB of high current rating in instantaneous tripping

8.3.3.1.2

60947-2(ed.4)

Standard-
IEC 60947-2 (2006-04, 4th Ed.)
* o) A7 X) a1 e5 O9 JSub clause(s):
8.3.3.1.2
# |: t* j/ n5 t8 pSheet:
DSH 659
Subject:
Problem of setting a current applied to ACB of
high current rating for instantaneous tripping.
) ^3 f. Z6 |  K" N) y- `7 eKey words:
. @) K" F" |$ @Trip limits &
; t, b  S/ Z1 A5 ]! Ocharacteristics
Approved at
the 45th CTL
: o2 k- C' O$ R, D$ l, _) nPlenary
% X' E7 ?) ~' j  Z1 eMeeting in
Prague in 2008
7 d* Y, p) F2 l! \. ZQuestion:
6 }1 O" i+ J# n* r/ h5 @" h$ c+ z: m" _According to 8.3.3.1.2, when the over-current opening release is a built-in part of the
) j' Y% b% [* Icircuit breaker, it shall normally be verified inside the corresponding circuit breaker.
& Y: K2 |% B- @, [  _For example, in case an air circuit-breaker (ACB) has a rating of 6300 A with an
instantaneous trip release up to 16 In, do we have to apply 80640 A (16 In x 80 %)
6 U4 Q4 c2 b# Rand 120960 A (16 In x 120 %) to the main circuit of ACB by use of a high power
testing facility when performing the trip test of SEQ. I?
- q: }/ k9 {! X5 ~. r" wRationale:
2 i8 D6 N8 m: BIt is not so easy to conduct the instantaneous trip test using the high currents
mentioned above, because to do so a high power testing facility is required. In
5 l' o' ?+ b1 y7 }: Taddition ACBs often have several ratings, which are determined by the specification
of the CT in combination with the trip unit, and the trip unit is usually the same for all
2 c8 \3 ], V2 V" [models.
So some accredited testing laboratories have performed this test by applying the
secondary current of CT (normally 5 A) to the input of an overcurrent release. This
release is connected to operating mechanism of contacts to check the mechanical
) }. H4 F2 \0 o; x# W7 X/ `opening of an ACB. But by use of this method, we bypass possible problems such
4 {7 U( l! G* E, }as CT saturation, thermal and EMC influence on ACB, especially on single-pole
connection.
Decision:
The secondary current of the CT (reduced current, 5 A, for example) may be used
8 K( }- K6 z. c7 P% t( Rfor trip tests of ACBs integrated with electronic OCR for all ratings of In, but only for
& j) |9 H3 G+ R: q' }$ ]: _sub-clause 8.3.3.1.2 of SEQ I.
But in addition, followings items shall be verified to fully cover the safety aspects of
the standard:
9 [$ b3 C1 {  M1 ?9 i, L1. The conformity of the performance (at least turn ratio and composite error)
. k0 s5 q+ Z3 |& W- J) Yof the CT or Rogowski coil, if any, shall be verified by specifications, test
reports or certificates. All CTs of the circuit-breakers of the given frame
, a2 u& y: s8 W" ysize have to show the same performance characteristic.
- ~3 }- T. X) d+ i3 p' _! I$ j7 D2. The single pole short-circuit test with a current equal to 80 % of the
" f5 s  }3 C+ ^0 |8 K/ Nmaximum current setting of the instantaneous release and equal to 120 %
  F0 {+ P. F% j7 r( fof the maximum current setting of the instantaneous release shall be
" A3 S, P9 @: K) a1 g! L5 Y7 iperformed at any convenient voltage with the current in the main poles of
the circuit-breaker. The other tests required by the standard may be
conducted by use of a simulated input signal to the tripping unit.

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