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| DSH 420
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& ~; ~6 _+ H- q, U9 Y+ H# k1 l | Enclosure leakage current caused by external voltage
$ R2 {, |/ Y; D% Q) e | 19, 19.2 c)
' `# }3 m) H0 J9 ]# ]2 a- D- q | 60601-1(ed.2);am1;am2
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Standard(s)- (year and edition):- E" P! Y$ X6 {
IEC 60601-1:1988 Ed.2 Am1+Am2
' |# p- X" H3 u% ~' _% U" m+ i( e( ASub clause(s): 19, 19.2 c)
- K( |1 p0 F. U/ @; ISheet n°: DSH-420' N3 D) L- x+ D# H% ]+ |
Subject: Enclosure leakage current caused by external voltage
6 O2 z# i( l" S2 B# AKey words: Enclosure, leakage current, external voltage
9 x/ b- B3 L/ B" fConfirmed by CTL at its 39th meeting, in Cologne
6 Z0 l8 O5 e' V- kQuestion:
+ T+ h0 G U$ q8 I X1 VSince INTERNALLY POWERED EQUIPMENT has no reference to earth, the ENCLOSURE3 Q. Q) U R9 ~1 g2 g8 [
LEAKAGE CURRENT flowing between different parts of the ENCLOSURE will not be affected
3 I# ]; [' ?% d, Aby an external voltage applied between earth and a SIGNAL INPUT or SIGNAL OUTPUT( J2 H8 m/ |. T
PART. Therefore the ENCLOSURE LEAKAGE CURRENT for INTERNALLY POWERED5 e& W% w' b+ o3 y! y1 y
EQUIPMENT caused by such a voltage, should be measured as for CLASS II EQUIPMENT
# t4 M7 E u' h* {, Z# twith MD1 between the ENCLOSURE and earth according to Figure 18. Further, the external" v# ~$ {! @# [8 x Y% B* a
voltage to be applied should be specified in Sub-clause 19.4 g) 3), in a similar way as in Subclause
: O) K% j( a8 x5 L) g6 t7 J19.4 h) 8) and Figure 25 (Measurement of the PATIENT LEAKAGE CURRENT flowing
3 V" m4 Z: ~- kfrom the APPLIED PART to earth, caused by an external voltage between earth and any% P# }/ e6 J" k5 @% K
SIGNAL INPUT or SIGNAL OUTPUT PART), except that supply frequency does not apply for w: h5 U6 | a
EQUIPMENT with an internal battery.# _! R$ |) ], q" _; j: p# O. e
Decision: s4 T* J9 U4 X) x) h+ }
To clarify this issue, Sub-clause 19.4 g) 3) should read : .......”and INTERNALLY POWERED& h5 r, M( F5 o! J; I* q
EQUIPMENT are tested for ENCLOSURE LEAKAGE CURRENT flowing between the
% u+ A. p5 @, i( EENCLOSURE and earth and also between different parts of the ENCLOSURE (measuring \. q4 N4 A( o3 J) b
device applied as MD1 and MD2 in Figure 18).”" }$ D: e$ K' g
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