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Question
n; `& E: }( H- o G8 K3 d% H8 Z7 |In which way shall the temperature rise test be carried out on a device composed of two or more$ G* ~0 l4 Z5 |' q2 B
switches, having the same or different pattern number mounted on a common body?' n1 n8 e0 E- H$ U; \
The construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
" `9 z3 o) K) Y, \, min different ways in clause 17.1.4 G: M$ \) ^7 O8 j, |9 }# Z3 i
Decision
: o) O! L/ T$ d3 YThe temperature rise test shall be performed separately on each individual switch on condition that it
: D$ u0 P, \# A* F! G& `9 B; Ois a single-phase switch.
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