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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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/ N$ Y1 r. @, [) p. {* ^) j2 MPage 98 T, Y9 o6 c& [' m( H; r, i1 B
1 Scope and object
" \ B v+ J6 j( x4 DReplace the title of this clause by “Scope”+ w. o5 ` i [6 j/ z/ { K9 q
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
' y8 H- |3 O$ sPage 11, }1 x% E7 C l. R9 \" J6 E
2 Normative references
2 k$ h' J6 ^1 p& E \Replace the text by the following:1 o! D: |: m9 D
The following referenced documents are indispensable for the application of this document.
p/ M8 [& [; n% @) Y" e' U. ]. yFor dated references, only the edition cited applies. For undated references, the latest edition
g) u, N' C1 G$ y5 Mof the referenced document (including any amendments) applies.
$ _* [ d: Z% w2 ?4 iIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
0 O. f+ K6 ]/ Z$ q6 @Electromagnetic compatibility
% }8 _6 s5 m# _/ ]' }( h9 P: Q- M2 w( G6 S W! w
% W: d9 x3 P& S& j0 q# e' Z) m, n- k
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –$ M' F* h7 D4 @
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
' M, e9 H J# rmeasurement techniques – Electrostatic discharge immunity test
2 \4 N2 [# D9 D) pAmendment 1:1998
( L8 f1 M" F4 I0 G$ @4 f, e+ NAmendment 2:200017 F! E! T: Y1 k
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and. v4 I6 N$ T1 q; |! C+ y- \* C1 ]
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test3 A/ n1 [! {1 ?4 o1 i
Amendment 1:20072
1 I2 f% W6 u' RIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
" h- m5 A- t6 E4 Zmeasurement techniques – Electrical fast transient/burst immunity test) l4 T% @, m9 ]# ?! A
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
* _0 V9 O$ I8 u: ~7 Y- c; Mmeasurement techniques – Surge immunity test
. \- d3 J: O' ?( j; \ z2 H! _IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and$ i m. m: G, Y7 H
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency1 y7 s! Y! D. \4 S( v& M! g: |
fields+ z0 Q2 O1 P) `2 V6 V& Q
Amendment 1:2004
0 e0 i2 v& U- f! b5 m2 y+ u! JAmendment 2:200633 `; B1 t3 Q# v/ d$ D: ^; |* G1 N
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
% O- \" O$ \- m9 h( Emeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests% l( Q6 [6 W7 s& ~/ w
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,6 ?* J0 K6 _6 C
electric tools and similar apparatus – Part 1: Emission
/ C2 V" h6 Z$ U) Y! y$ X9 i& ~Page 133 {" c5 o6 v# k0 j
3 Definitions0 i1 G: z. |% r5 _
Replace the title of this clause by “Terms and definitions”.9 c/ j& W ?8 |2 |, o) n
Replace the first paragraph by the following:
( W% |' O# f- u6 G4 H' AFor the purposes of this document, the terms and definitions related to EMC and related6 b1 j1 z# D; ]# l) Q
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
! c3 h8 E8 b( P1 SAdd the following new definition:, P! k8 L/ s) |" U/ \; z$ R
3.18; y+ \4 _+ {, B8 V; t
clock frequency
* C2 P7 P# K) H. ]; Kfundamental frequency of any signal used in the device, excluding those which are solely; v# q7 N) Y4 L4 ~' c; g x( x
used inside integrated circuits (IC)
. f* S ~9 X. lNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
3 v; F! n3 }: k# Efrom lower clock oscillator frequencies outside the IC.2 J6 O3 G" ^ Z6 v3 @, D
___________1 I7 H. T |, Z$ X! p% J
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
2 Y. q* I: l" X7 |! W2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.& n/ T$ K( e& l! Y9 r" j) ^
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.; \) W; j% r. n2 z( U. H
& L' f- v$ v- o$ Y# @$ f; Y- X+ k6 {- @* C0 t
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
. r, G' \: R. P0 {6 BPage 13
# U. S0 T, m& d4 Classification of apparatus
8 V/ {4 M9 a1 l4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
9 e9 C& W( q% [/ p6 |Page 15
4 F( a4 Q8 z, k3 w; |5 Tests
# U* {1 l9 k$ EThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.5 P# _5 }# n* e! H4 ~: Y: O
Page 21
% r$ H) _& x9 l# r4 M5.6 Surges+ x6 j" u: ]) n/ G9 w! r% g
Table 12 – Input a.c. power ports2 E" L2 j/ b4 O8 s. g+ z0 C2 ^
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
|; f- l- W; E& A, l4 J8 O"Line-to-Line with 2 Ω Impedance".
5 {' v! t( ]4 w" m- CAfter Table 12, add the following paragraph as a new second paragraph:+ Y# Y0 o1 x0 Y$ T/ N, N- h, ]
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
$ r# ?9 S2 ^% U# v1 O& C5 a6 qequipment under test, and the negative pulses are applied 270° relative to the phase angle of+ X: x" W$ N% n
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those8 q5 Z/ _+ i! C9 _
given in Table 12 are not required.
" [7 L# z# X+ R: E3 M# H5.7 Voltage dips and interruptions
1 p9 u" W1 v" x! F" tTable 13 – Input a.c. power ports
% Z9 f& `; E/ UReplace the existing Table 13 by the following new Table 13:; g1 c6 L B j; Q8 j) R
Table 13 – Input a.c. power ports' m7 Q" f' ~) h1 o: Z( T
Durations for voltage dips, N' u* e/ r m9 Z6 P1 U8 D% K4 b
Environmental Test set-up# _# Y4 z9 u$ ^' F$ h& ]- m
phenomena. H, @% b; T8 O/ F2 W
Test level! v! C# A" h* x1 r0 p1 U9 Y7 K
in % UT1 [9 ~1 B3 U) s; V$ b- y: X
50 Hz 60 Hz/ n1 a- a/ t d$ R6 d( L7 L; P# r
Voltage dips( e) i. k& A' \, j- c$ O/ X
in % UT
1 m" O9 k2 Y) [0 h100: |$ Q4 S4 R1 {% a
605 @" X; s" k0 g+ b d" R7 }
302 ~+ R4 B1 }; F) n" X7 V& R9 y9 K
0, K: @9 n/ f; e
40- K7 w! K5 v/ O7 n
703 P" J& [& M3 X" {3 e* p
0,5 cycle* Y6 p. i- b# A
10 cycles
+ d: W6 u. Q! L7 x4 f2 _25 cycles
- x4 _4 q/ ?% v- }7 u) |9 T( Z8 }0,5 cycle
9 s6 K* a1 c5 Y2 d% Q+ P12 cycles# t# l+ G* l) T5 @+ @3 o. M2 X
30 cycles6 L" `1 H7 S# s+ }) L% Y$ ~2 Q
IEC 61000-4-11 b+ Z+ {. L$ F8 i! r8 h
Voltage change shall' A: U- w. d! ?6 d- ]0 Z- w1 m2 F
occur at zero crossing
1 ~+ k$ `- U' O4 T+ T4 _! uUT is the rated voltage of the equipment under test.
) k# A2 `. d+ }# G" `
# B# e3 ?& D i7 ]& e" ^% _: z B9 H a( O: Q$ H! T0 K
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –/ r5 [. d* V( w. w" D/ c8 {
Page 27
9 X; J6 n( u$ m' y, z3 ]! A8 Conditions during testing4 p6 [1 Q y) g1 Z. t! K
8.1 Replace the first paragraph by the following paragraph:; Q+ o7 Z- X: N# S. T6 d" R
Unless otherwise specified, the tests shall be made while the apparatus is operated as0 @' w* t1 K+ v$ g7 N# |/ D8 c
intended by the manufacturer, in the most susceptible operating mode consistent with normal
4 \$ I0 l3 H# H- {use.
# o0 \' @3 C& m8.4 Delete the second sentence.. Y9 J! e3 A& ^8 R8 B' A5 r; A5 T ~
8.7 Delete this subclause.
" ~9 R: \3 l" ?2 [6 K& a$ I2 y8.8 Renumber this subclause as 8.7
$ v9 G7 U" a1 vPage 29
" v$ e. O2 x' Q* _+ p% V! a9 Assessment of conformity( e/ S) q/ E, e4 s
9.2 Statistical evaluation, o) M7 ^! R& [+ _- B r* ?) ]% E
Replace the existing Note by the following:
* e5 P1 E' N: ONOTE For general information on the statistical consideration in the determination EMC compliance, see
( e$ c' k. t* s% k1 h& y& D5 s6 G. s, sCISPR/TR 16-4-3.* p4 K: Q: w+ _2 m; F% D
Page 31/ ?) \$ P, k: c( z! b
10 Product documentation
( s; f# N2 J( _5 l E' }+ qDelete this clause.
% M- s' c7 e! d6 G" }Bibliography# U* w R9 n9 s5 ~! O* o
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:) y+ M. C1 S0 S, H6 J
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and! b2 G' N: R/ W B- i
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in# }3 O- h" R0 B, M
the determination of EMC compliance of mass-produced products (only available in English) |
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