|
|
|  DSH 405/ ]2 R) ]& F, `+ f- G
b, b' e5 E' u4 S m4 P | Leakage current in secondary circuits# Y* f- h' h' x( z3 D% q
| 17g)/ Z" _: p, B# X3 h" ^7 m
| 60601-1(ed.2);am1;am2
+ u1 k- N9 A+ V! O |
; f: k4 |$ i* A; zStandard(s)- (year and edition):9 F. N/ A7 |& ?& O- C! a* t: I
IEC 60601-1:1988 Ed.2 Am1+Am2
) F) b' l5 V) P6 nSub clause(s): 17 g)
7 z; ^% s# c4 ]4 \, N: ~/ ySheet n°: DSH-4052 ~) _7 X% Y8 {+ W3 L1 P& G
Subject: Leakage current in secondary circuits8 y' w( ?0 E. u4 o) g3 m3 J2 M0 Z
Key words: Leakage current, secondary circuit' l# A- D5 D7 C3 ^# x
Confirmed by CTL at its 39th meeting, in Cologne
: m. u5 Q8 S6 r( O* hQuestion:
+ H& L4 M- |1 |, xIf secondary circuit impedances limit the leakage current, is further investigation of secondary0 y2 O: l: h# S8 T
circuits required? (refer to sub-clause 52.5)./ {7 ]/ S9 p# u7 K8 {# C
Decision:/ x& n* B" I! |6 ^- q. t
Secondary circuits providing protective means after short-circuiting of inadequate AIR
6 F7 N5 Q5 s/ n" m6 I( V. a6 A, jCLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in# Y) F/ f7 s0 s5 {3 r6 L
these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such
: s" X. _6 l, M) @$ D8 ccomponents shall be investigated as a SINGLE FAULT CONDITION.* E6 Y o5 I! v
6 Q- m/ A) o, q' q1 Z+ z7 v8 n, q7 F
|
本帖子中包含更多资源
您需要 登录 才可以下载或查看，没有帐号？注册安规
x
|
/2 
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 ) 
窥视卡
雷达卡
发表于 2012-11-5 11:42
收藏
分享
好帖
鸡蛋
提升卡
置顶卡
沉默卡
喧嚣卡
变色卡
抢沙发
千斤顶
显身卡