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- Q, Z, w" x- K& yDSH 368+ U+ v/ ]" `8 H# _1 `4 W4 ]$ z/ G
| Overload test
, D$ r% }* ?4 m+ J! j) M | 14.7.2/4.4.2.6
2 v L) t0 }7 j3 m+ O. f% n+ D | 61010-1(ed.1);am1;am2
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Standard:
& ~' I- S7 o* p$ [IEC 61010-1:1990 +A1:1992 + A2
; ?* u; \8 ?4 N: ~( T:1995/ p# f! D6 G8 L1 E1 e7 L) F
Sub clause:
$ B. [5 _3 p4 K8 y5 A/ {. G4 S3 B14.7.2/4.4.2.6
+ i% l# G5 b/ [, \6 D @- mSheet n. 368
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Subject:' m, v2 u, v5 }4 d2 W
Overload test
/ d8 E) \, T! gKey words:
$ P+ b/ S/ |- E$ j0 a' F- Mains transformer1 O* d* L7 h2 `1 H+ z
- SFC tests# Q5 S4 M) T* H, b0 k6 K
Decision taken by
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by CTL at its 38th+ m6 a' }* ?' T; C6 D% r3 \
meeting, in Toronto
/ y4 I3 ` \ Y* A* ^Question:4 ]( B ?& x; t; R' H
What criteria should be used when deciding whether or not to do the overload test as there
8 o- p3 Q& x! X1 x) kseems to be subjectivity involved when considering the requirements?- B% O" ^4 r N* M- L: E
Decision:8 n% @$ h) n$ \0 J# M0 P- k
It was decided that transformers should be considered for SFC tests (short circuit and4 U; k5 i5 N. u" e/ B8 q
overload tests) under the worst possible scenario.- @/ l$ _/ W: m
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