标题: DSH 1035 [打印本页] 作者: chinatown 时间: 2017-1-7 10:59 标题: DSH 1035 Question 0 [3 A. F" N9 y0 V' M9 i, |In which way shall the temperature rise test be carried out on a device composed of two or more1 r' `1 X6 j2 a3 D0 G' f! o) Q, i9 Q
switches, having the same or different pattern number mounted on a common body? ; Q$ Y* `$ ~8 ~8 n% w! RThe construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable, O: g; b# s# j- Y5 q' f
in different ways in clause 17.1.2 A! I+ I* ?! ? E
Decision: c( E2 E4 w* p9 R n; ?# n8 R2 \
The temperature rise test shall be performed separately on each individual switch on condition that it% l: P; @' H. U0 [5 C# d- Z8 z
is a single-phase switch.) J/ ]+ _, G' |, N; T3 T" E
[attach]110431[/attach] " K2 w2 q; u2 G& K' B) }% l" E4 v6 x/ u
[attach]110431[/attach]. L( x- E& V; b